The SS-120 measures a wavelength range of 635 to 1100 nm. The spectroradiometer is an easy-to-use, cost-effective, versatile spectral measurement system that can be interfaced to a computer. Typical applications include measurement of spectral output (energy flux density, photon flux density, or illuminance) of different radiation sources (often for plant or human lighting), and reflectance and transmittance measurements of natural and synthetic surfaces and materials (often plant leaves and canopies).
The SS-120 package includes:
Spectroradiometer unit and cosine corrected detector mounted in the housing
180° FOV head and black cap
USB cable for computer interface
2GB USB drive with ApogeeSpectrovision software (Windows compatible, XP and later; Mac compatible, 10.10 and later) and required drivers
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Wavelength Range635 to 1100 nmWavelength Measurement Interval1 nmWavelength Resolution3.0 nm (full-width, half-maximum)Wavelength Accuracy± 0.5 nmWavelength Repeatability± 0.2 nmAnalog to Digital Resolution14 bitSignal to Noise Ratio1500:1 (at maximum signal)Stray Light≤; 0.25 %at 850 nmDark Noise≤ 3 countsIntegration Time Range10 ms to 10 sMeasurement SensitivityGreater than 10 % of max sensitivity for wavelengths less than 1030 nmMeasurement RepeatabilityLess than 1.0 % (wavelengths less than 1020 nm)Directional (Cosine) Response± 5 % at 75 ˚ zenith angleFields of View180 ˚ (upward-facing), 25 ˚ or 150 ˚ (downward-facing)Temperature Response-0.1 ± 0.1 % per CCurrent Draw190 mA during measurement and when idle (USB)Power Requirement1 W (USB)Interface Cable5 m PVC jacket with USB (for computer)SoftwareApogee Spectrovision (windows compatible, XP and later, Mac compatible, 10.9 and later)Operating Environment-20 to 70 C, 0 to 100 % relative humidityThread Size (for Mounting)1/4" - 20Dimensions89.3 mm height, 50.8 mm width, 38.1 mm depthMass300 gWarranty1 year against defects in materials and workmanship