The SS-110 measures a wavelength range of 340 to 820 nm. The spectroradiometer is an easy-to-use, cost-effective, versatile spectral measurement system that can be interfaced to a computer. Typical applications include measurement of spectral output (energy flux density, photon flux density, or illuminance) of different radiation sources (often for plant or human lighting), and reflectance and transmittance measurements of natural and synthetic surfaces and materials (often plant leaves and canopies).
The SS-110 package includes:
Spectroradiometer unit and cosine corrected detector mounted in the housing
180° FOV head and black cap
USB cable for computer interface
2GB USB drive with ApogeeSpectrovision software (Windows compatible, XP and later; Mac compatible, 10.10 and later) and required drivers
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Wavelength Range340 to 820 nmWavelength Measurement Interval1 nmWavelength Resolution3.0 nm (full-width, half-max)Wavelength Accuracy± 0.5 nmWavelength Repeatability± 0.2 nmAnalog to Digital Resolution14 bitSignal to Noise Ratio1500:1 (at maximum signal)Stray Light≤ 0.25 % at 590 nmDark Noise≤ 3 countsIntegration Time Range10 ms to 10 sLinearityLess than 1 % or 0.5 %Measurement SensitivityGreater than 10 % max sensitivity for wavelengths greater than 380 nmMeasurement RepeatabilityLess than 1.0 % (wavelengths greater than 400 nm)Directional (Cosine) Response± 5 % at 75 ˚ zenith angleFields of View180 ˚ (upward-facing), 25 ˚ or 150˚ (downward-facing)Temperature Response-0.1 ± 0.1 % per CIrradiance Calibration Uncertainty± 5 %Current Draw190 mA during measurement and when idle (USB)Power Requirement1 W (USB)Interface Cable5 m PVC jacket with USB (for computer)SoftwareApogee Spectrovision (windows compatible, XP and later; Mac compatible, 10.9 and later)Operating Environment-20 to 70 C, 0 to 100 % relative humidityThread Size (for Mounting)1/4 " - 20Dimensions89.3 mm height, 50.8 mm width, 38.1 mm depthMass300 gWarranty1 year against defects in materials and workmanship