SS-110: Field Spectroradiometer-340 to 820 nm

$2,764.00

The SS-110 measures a wavelength range of 340 to 820 nm. The spectroradiometer is an easy-to-use, cost-effective, versatile spectral measurement system that can be interfaced to a computer. Typical applications include measurement of spectral output (energy flux density, photon flux density, or illuminance) of different radiation sources (often for plant or human lighting), and reflectance and transmittance measurements of natural and synthetic surfaces and materials (often plant leaves and canopies).

The SS-110 package includes:

  1. Spectroradiometer unit and cosine corrected detector mounted in the housing
  2. 180° FOV head and black cap
  3. AL-200 bubble-level
  4. USB cable for computer interface
  5. 2GB USB drive with ApogeeSpectrovision software (Windows compatible, XP and later; Mac compatible, 10.10 and later) and required drivers
  6. Carrying case
Full Description
Where to Buy

The SS-110 measures a wavelength range of 340 to 820 nm. The spectroradiometer is an easy-to-use, cost-effective, versatile spectral measurement system that can be interfaced to a computer. Typical applications include measurement of spectral output (energy flux density, photon flux density, or illuminance) of different radiation sources (often for plant or human lighting), and reflectance and transmittance measurements of natural and synthetic surfaces and materials (often plant leaves and canopies).

The SS-110 package includes:

  1. Spectroradiometer unit and cosine corrected detector mounted in the housing
  2. 180° FOV head and black cap
  3. AL-200 bubble-level
  4. USB cable for computer interface
  5. 2GB USB drive with ApogeeSpectrovision software (Windows compatible, XP and later; Mac compatible, 10.10 and later) and required drivers
  6. Carrying case

We are currently looking for case studies for this product. If you would like to share your application of this product, please click here.

Current Stock:
Wavelength Range 340 to 820 nm Wavelength Measurement Interval 1 nm Wavelength Resolution 3.0 nm (full-width, half-max) Wavelength Accuracy ± 0.5 nm Wavelength Repeatability ± 0.2 nm Analog to Digital Resolution 14 bit Signal to Noise Ratio 1500:1 (at maximum signal) Stray Light ≤ 0.25 % at 590 nm Dark Noise ≤ 3 counts Integration Time Range 10 ms to 10 s Linearity Less than 1 % or 0.5 % Measurement Sensitivity Greater than 10 % max sensitivity for wavelengths greater than 380 nm Measurement Repeatability Less than 1.0 % (wavelengths greater than 400 nm) Directional (Cosine) Response ± 5 % at 75 ˚ zenith angle Fields of View 180 ˚ (upward-facing), 25 ˚ or 150˚ (downward-facing) Temperature Response -0.1 ± 0.1 % per C Irradiance Calibration Uncertainty ± 5 % Current Draw 190 mA during measurement and when idle (USB) Power Requirement 1 W (USB) Interface Cable 5 m PVC jacket with USB (for computer) Software Apogee Spectrovision (windows compatible, XP and later; Mac compatible, 10.9 and later) Operating Environment -20 to 70 C, 0 to 100 % relative humidity Thread Size (for Mounting) 1/4 " - 20 Dimensions 89.3 mm height, 50.8 mm width, 38.1 mm depth Mass 300 g Warranty 1 year against defects in materials and workmanship